Nanoindentation in situ a Transmission Electron Microscope
The technique of Nanoindentation in situ Transmission Electron Microscope has been implemented on a Philips CM20. Indentations have been performed on Si and Sapphire (α-Al2O3) cut from wafers; Cr/Sc multilayers and Ti3SiC2 thin films. Different sample geometries and preparation methods have been eva...
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| Format: | Others |
| Language: | English |
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Linköpings universitet, Institutionen för fysik, kemi och biologi
2007
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| Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-8333 |