Design of an in-field Embedded Test Controller
Electronic systems installed in their operation environments often require regular testing. The nanometer transistor size in new IC design technologies makes the electronic systems more vulnerable to defects. Due to certain reasons like wear out or over heating and difficulty to access systems in re...
| Main Authors: | , |
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| Format: | Others |
| Language: | English |
| Published: |
Linköpings universitet, ESLAB - Laboratoriet för inbyggda system
2011
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| Subjects: | |
| Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-70791 |