Deterministisk Komprimering/Dekomprimering av Testvektorer med Hjälp av en Inbyggd Processor och Faxkodning
Modern semiconductor design methods makes it possible to design increasingly complex system-on-a-chips (SOCs). Testing such SOCs becomes highly expensive due to the rapidly increasing test data volumes with longer test times as a result. Several approaches exist to compress the test stimuli and wher...
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| Format: | Others |
| Language: | Swedish |
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Linköpings universitet, Institutionen för datavetenskap
2005
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| Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-2855 |