Analysis and Evaluation of Sequential Redundancy Identification Algorithms

This thesis has a goal of analysing different methods used for identifying redundant faults in synchronous sequential circuits as a part of reducing the complexity of ATPG algorithms and minimizing the test sets. It starts with an overview of various faults which occur in digital circuits of differe...

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Main Author: Kuznetsova, Yulia
Format: Others
Language:English
Published: KTH, Skolan för informations- och kommunikationsteknik (ICT) 2011
Subjects:
Online Access:http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-51105
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spelling ndltd-UPSALLA1-oai-DiVA.org-kth-511052013-01-08T13:51:10ZAnalysis and Evaluation of Sequential Redundancy Identification AlgorithmsengKuznetsova, YuliaKTH, Skolan för informations- och kommunikationsteknik (ICT)2011TECHNOLOGYTEKNIKVETENSKAPThis thesis has a goal of analysing different methods used for identifying redundant faults in synchronous sequential circuits as a part of reducing the complexity of ATPG algorithms and minimizing the test sets. It starts with an overview of various faults which occur in digital circuits of different types and moves on to the common testing methods used for fault detection. As it is not possible to perform an exhaustive search in order to detect every possible fault in any given circuit due to time and power consumption issues, there are certain needs for minimizing the set of tests which detects the existing faults. Therefore discovering the untestable and redundant faults is so important when testing. The overview of both classical and novel methods for detecting untestable and redundant faults is presented followed by the analysis of the results and the benefits each of these methods promises. Student thesisinfo:eu-repo/semantics/bachelorThesistexthttp://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-51105Trita-ICT-EX ; 239application/pdfinfo:eu-repo/semantics/openAccess
collection NDLTD
language English
format Others
sources NDLTD
topic TECHNOLOGY
TEKNIKVETENSKAP
spellingShingle TECHNOLOGY
TEKNIKVETENSKAP
Kuznetsova, Yulia
Analysis and Evaluation of Sequential Redundancy Identification Algorithms
description This thesis has a goal of analysing different methods used for identifying redundant faults in synchronous sequential circuits as a part of reducing the complexity of ATPG algorithms and minimizing the test sets. It starts with an overview of various faults which occur in digital circuits of different types and moves on to the common testing methods used for fault detection. As it is not possible to perform an exhaustive search in order to detect every possible fault in any given circuit due to time and power consumption issues, there are certain needs for minimizing the set of tests which detects the existing faults. Therefore discovering the untestable and redundant faults is so important when testing. The overview of both classical and novel methods for detecting untestable and redundant faults is presented followed by the analysis of the results and the benefits each of these methods promises.
author Kuznetsova, Yulia
author_facet Kuznetsova, Yulia
author_sort Kuznetsova, Yulia
title Analysis and Evaluation of Sequential Redundancy Identification Algorithms
title_short Analysis and Evaluation of Sequential Redundancy Identification Algorithms
title_full Analysis and Evaluation of Sequential Redundancy Identification Algorithms
title_fullStr Analysis and Evaluation of Sequential Redundancy Identification Algorithms
title_full_unstemmed Analysis and Evaluation of Sequential Redundancy Identification Algorithms
title_sort analysis and evaluation of sequential redundancy identification algorithms
publisher KTH, Skolan för informations- och kommunikationsteknik (ICT)
publishDate 2011
url http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-51105
work_keys_str_mv AT kuznetsovayulia analysisandevaluationofsequentialredundancyidentificationalgorithms
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