Force measurements using scanning probe microscopy : Applications to advanced powder processing

Force measurements using scanning probe microscopy : Applications to advanced powder processing

The object of this thesis is to apply scanning probemicroscopy (SPM) to the field of advanced powder processing.Measurement of interparticle surface forces at conditionsrelevant to ceramic processing has been performed together withthorough studies of powder friction. Surface force measurements betw...

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Bibliographic Details
Main Author:	Meurk, Anders
Format:	Doctoral Thesis
Language:	English
Published:	KTH, Kemi 2000
Subjects:	atomic force microscope AFM SPM van der Waals interaction DLVO-theory surface forces colloidal probe force curve friction adhesion stick-slip cantilever calibration spring constant silicon nitride iron silica
Online Access:	http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-3023 http://nbn-resolving.de/urn:isbn:91-628-4393-1

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