Cross-Sectional Scanning Tunneling Microscopy Studies of In 1-xGax Sb/InAs Quantum Dots
This thesis focuses on the characterization of In 0,4 Ga 0,6 Sb/InAs and InSb/InAs quantum dots using Cross-Sectional Scanning Tunneling Microscopy (X-STM). Quantum dots (QDs) are small and spatially confined semiconductor nanostructures with a size-dependent band gap. This property makes them very...
| Main Authors: | , |
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| Format: | Others |
| Language: | English |
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KTH, Skolan för informations- och kommunikationsteknik (ICT)
2012
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| Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-101481 |