Thin Mn silicide and germanide layers studied by photoemission and STM

Thin Mn silicide and germanide layers studied by photoemission and STM

The research presented in this thesis concerns experimental studies of thin manganese silicide and germanide layers, grown by solid phase epitaxy on the Si(111)7×7 and the Ge(111)c(2×8) surfaces, respectively. The atomic and electronic structures, as well as growth modes of the epitaxial Mn-Si and M...

Full description

Bibliographic Details
Main Author: Hirvonen Grytzelius, Joakim
Format: Doctoral Thesis
Language:English
Published: Karlstads universitet, Avdelningen för fysik och elektroteknik 2012
Subjects:
Semiconductor surfaces
Si(111)
Ge(111)
manganese
Mn
silicides
germanides
atomic structure
electronic structure
magnetic properties
LEED
ARPES
XPS
core-level spectroscopy
STM
STS
XMCD
Online Access:http://urn.kb.se/resolve?urn=urn:nbn:se:kau:diva-14488
http://nbn-resolving.de/urn:isbn:978-91-7063-448-2

Internet

http://urn.kb.se/resolve?urn=urn:nbn:se:kau:diva-14488
http://nbn-resolving.de/urn:isbn:978-91-7063-448-2

Similar Items