Comprehensive Analysis of Leakage Current in Ultra Deep Sub-micron (udsm) Cmos Circuits
Aggressive scaling of CMOS circuits in recent times has lead to dramatic increase in leakage currents. Previously, sub-threshold leakage current was the only leakage current taken into account in power estimation. But now gate leakage and reverse biased junction band-to-band-tunneling leakage curren...
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| Format: | Others |
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ScholarWorks@UMass Amherst
2007
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| Online Access: | https://scholarworks.umass.edu/theses/46 https://scholarworks.umass.edu/cgi/viewcontent.cgi?article=1079&context=theses |