The determination of impurity concentrations in silicon
Due to the small concentration of impurities normally present in semiconductors these impurity concentrations cannot' be measured by ordinary chemical analysis. Electrical methods are the common way by which semiconductor impurity concentrations are measured. The specific problem investigated...
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| Language: | English |
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University of British Columbia
2011
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| Online Access: | http://hdl.handle.net/2429/39457 |