Infrared absorption in arsenic-doped silicon

The optical absorption line is 1s₁- 2p₀ at the absorption spectrum of arsenic doped silicon has been studied for various arsenic concentrations at four temperatures. The concentrations are .9 x 10¹⁵ cm⁻³, 1.7 x 10¹⁵ cm⁻³, 4.0 x 10¹⁵ cm⁻³ and 1.5 x 10¹⁶ cm⁻³, the temperatures are 4.2°K, 53°K, 77°K, a...

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Main Author: Goruk, William
Language:English
Published: University of British Columbia 2011
Subjects:
Online Access:http://hdl.handle.net/2429/37623
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spelling ndltd-UBC-oai-circle.library.ubc.ca-2429-376232018-01-05T17:48:53Z Infrared absorption in arsenic-doped silicon Goruk, William Silicon Absorption spectra The optical absorption line is 1s₁- 2p₀ at the absorption spectrum of arsenic doped silicon has been studied for various arsenic concentrations at four temperatures. The concentrations are .9 x 10¹⁵ cm⁻³, 1.7 x 10¹⁵ cm⁻³, 4.0 x 10¹⁵ cm⁻³ and 1.5 x 10¹⁶ cm⁻³, the temperatures are 4.2°K, 53°K, 77°K, and 90°K. Spectrometer broadening was accounted for in the observed line-widths. There was observed two temperature independent broadening mechanisms, concentration and strain broadening. Two temperature dependent broadening mechanisms were observed, phonon broadening and the statistical Stark effect. The five, broadening mechanisms are believed to account for the total line-width through the use of the Voigt analysis half-breadth method. A shift of the peak position with temperature was noted and a possible explanation presented. Science, Faculty of Physics and Astronomy, Department of Graduate 2011-09-26T23:37:17Z 2011-09-26T23:37:17Z 1964 Text Thesis/Dissertation http://hdl.handle.net/2429/37623 eng For non-commercial purposes only, such as research, private study and education. Additional conditions apply, see Terms of Use https://open.library.ubc.ca/terms_of_use. University of British Columbia
collection NDLTD
language English
sources NDLTD
topic Silicon
Absorption spectra
spellingShingle Silicon
Absorption spectra
Goruk, William
Infrared absorption in arsenic-doped silicon
description The optical absorption line is 1s₁- 2p₀ at the absorption spectrum of arsenic doped silicon has been studied for various arsenic concentrations at four temperatures. The concentrations are .9 x 10¹⁵ cm⁻³, 1.7 x 10¹⁵ cm⁻³, 4.0 x 10¹⁵ cm⁻³ and 1.5 x 10¹⁶ cm⁻³, the temperatures are 4.2°K, 53°K, 77°K, and 90°K. Spectrometer broadening was accounted for in the observed line-widths. There was observed two temperature independent broadening mechanisms, concentration and strain broadening. Two temperature dependent broadening mechanisms were observed, phonon broadening and the statistical Stark effect. The five, broadening mechanisms are believed to account for the total line-width through the use of the Voigt analysis half-breadth method. A shift of the peak position with temperature was noted and a possible explanation presented. === Science, Faculty of === Physics and Astronomy, Department of === Graduate
author Goruk, William
author_facet Goruk, William
author_sort Goruk, William
title Infrared absorption in arsenic-doped silicon
title_short Infrared absorption in arsenic-doped silicon
title_full Infrared absorption in arsenic-doped silicon
title_fullStr Infrared absorption in arsenic-doped silicon
title_full_unstemmed Infrared absorption in arsenic-doped silicon
title_sort infrared absorption in arsenic-doped silicon
publisher University of British Columbia
publishDate 2011
url http://hdl.handle.net/2429/37623
work_keys_str_mv AT gorukwilliam infraredabsorptioninarsenicdopedsilicon
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