A rapid-scan optical interferometric cross-correlator for time-resolved laser spectroscopy
The rapid progress of short pulse laser technology has provided a concomitant increase in the use of ultrashort lasers for the characterization of the optical and electronic properties of semiconductor nanostructures and devices. As the characteristic timescale of the phenomenon under investigati...
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| Format: | Others |
| Language: | English |
| Published: |
2009
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| Online Access: | http://hdl.handle.net/2429/3754 |