An embedded calibration technique for high-resolution flash time-to-digital converters
As CMOS technology continues to advance, device dimensions will continue to decrease, thus enabling the creation of circuits which operate at increasingly greater frequencies. However, this Increase In operating frequency has resulted in a reduced tolerance for circuit timing uncertainties. Therefor...
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| Language: | English |
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University of British Columbia
2011
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| Online Access: | http://hdl.handle.net/2429/31637 |