Enhancing the robustness of ESPI measurements using digital image correlation

Electronic Speckle Pattern Interferometry (ESPI) provides a sensitive technique for measuring surface deformations. The technique involves comparison of the speckle phase angles within surface images measured before and after material deformation. This phase angle comparison requires that the speckl...

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Bibliographic Details
Main Author: Bingleman, Luke
Language:English
Published: University of British Columbia 2010
Online Access:http://hdl.handle.net/2429/27540

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