Enhancing the robustness of ESPI measurements using digital image correlation
Electronic Speckle Pattern Interferometry (ESPI) provides a sensitive technique for measuring surface deformations. The technique involves comparison of the speckle phase angles within surface images measured before and after material deformation. This phase angle comparison requires that the speckl...
Main Author: | Bingleman, Luke |
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Language: | English |
Published: |
University of British Columbia
2010
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Online Access: | http://hdl.handle.net/2429/27540 |
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