On fault coverage and fault simulation for multiple signature analysis BIST schemes
Fault coverage and fault simulation issues related to multiple signature analysis (MSA) built-in self-test (BIST) schemes are treated here. A model to predict the fault coverage is presented. Based on this model, the nature of the fault coverage for MSA is discussed. The fault coverage of MSA is a f...
Main Author: | Zhang, Chun |
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Format: | Others |
Language: | English |
Published: |
2008
|
Online Access: | http://hdl.handle.net/2429/1572 |
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