On fault coverage and fault simulation for multiple signature analysis BIST schemes

On fault coverage and fault simulation for multiple signature analysis BIST schemes

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Fault coverage and fault simulation issues related to multiple signature analysis (MSA) built-in self-test (BIST) schemes are treated here. A model to predict the fault coverage is presented. Based on this model, the nature of the fault coverage for MSA is discussed. The fault coverage of MSA is a f...

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Main Author: Zhang, Chun
Format: Others
Language:English
Published: 2008
Online Access:http://hdl.handle.net/2429/1572
id ndltd-UBC-oai-circle.library.ubc.ca-2429-1572
record_format oai_dc
spelling ndltd-UBC-oai-circle.library.ubc.ca-2429-15722018-01-05T17:30:42Z On fault coverage and fault simulation for multiple signature analysis BIST schemes Zhang, Chun Fault coverage and fault simulation issues related to multiple signature analysis (MSA) built-in self-test (BIST) schemes are treated here. A model to predict the fault coverage is presented. Based on this model, the nature of the fault coverage for MSA is discussed. The fault coverage of MSA is a function of both the signature sizes and the schedulings. The problem of optimal signature scheduling in MSA to minimize fault simulation time is discussed. Using the developed model, for an arbitrary circuit under test (CUT), given the optimal scheduling positions, given the fault coverage data before data compaction, and given an aliasing threshold, the optimal MSA for the CUT can be readily designed in terms of signature sizes and number of signatures. Analysis and experimental results are presented. Applied Science, Faculty of Electrical and Computer Engineering, Department of Graduate 2008-08-28T22:34:37Z 2008-08-28T22:34:37Z 1993 1993-11 Text Thesis/Dissertation http://hdl.handle.net/2429/1572 eng For non-commercial purposes only, such as research, private study and education. Additional conditions apply, see Terms of Use https://open.library.ubc.ca/terms_of_use. 4027527 bytes application/pdf
collection NDLTD
language English
format Others
sources NDLTD
description Fault coverage and fault simulation issues related to multiple signature analysis (MSA) built-in self-test (BIST) schemes are treated here. A model to predict the fault coverage is presented. Based on this model, the nature of the fault coverage for MSA is discussed. The fault coverage of MSA is a function of both the signature sizes and the schedulings. The problem of optimal signature scheduling in MSA to minimize fault simulation time is discussed. Using the developed model, for an arbitrary circuit under test (CUT), given the optimal scheduling positions, given the fault coverage data before data compaction, and given an aliasing threshold, the optimal MSA for the CUT can be readily designed in terms of signature sizes and number of signatures. Analysis and experimental results are presented. === Applied Science, Faculty of === Electrical and Computer Engineering, Department of === Graduate
author Zhang, Chun
spellingShingle Zhang, Chun
On fault coverage and fault simulation for multiple signature analysis BIST schemes
author_facet Zhang, Chun
author_sort Zhang, Chun
title On fault coverage and fault simulation for multiple signature analysis BIST schemes
title_short On fault coverage and fault simulation for multiple signature analysis BIST schemes
title_full On fault coverage and fault simulation for multiple signature analysis BIST schemes
title_fullStr On fault coverage and fault simulation for multiple signature analysis BIST schemes
title_full_unstemmed On fault coverage and fault simulation for multiple signature analysis BIST schemes
title_sort on fault coverage and fault simulation for multiple signature analysis bist schemes
publishDate 2008
url http://hdl.handle.net/2429/1572
work_keys_str_mv AT zhangchun onfaultcoverageandfaultsimulationformultiplesignatureanalysisbistschemes
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