Embedded linearity test for ADCs
Recent years have seen an unparalleled growth in the speed and complexity of VLSI circuits. Analog and mixed-signal circuits are going through a resurgence and continue to pose new challenges to VLSI test engineers. Analog-to-digital converters (ADCs) are one of the most frequently used mixed-sig...
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| Format: | Others |
| Language: | English |
| Published: |
2009
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| Online Access: | http://hdl.handle.net/2429/11498 |