SRAM Variation Analysis and Peripheral R/W-Assist Circuits using Monolithic 3D BEOL FinFET Circuits
碩士 === 國立交通大學 === 國際半導體產業學院 === 108 === Monolithic 3D-IC is an enabling technology for reducing chip size and power consumption and enhancing the overall system performance and using BEOL circuits. To avoid damaging transistors on the bottom silicon layer, low thermal budget is required for while fa...
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| Format: | Others |
| Language: | en_US |
| Published: |
2019
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| Online Access: | http://ndltd.ncl.edu.tw/handle/hs6vda |