Implementation On Interferometric Signal Processing Techniques And Modules For Nano-Scale Displacement Measurement

碩士 === 國立臺北科技大學 === 自動化科技研究所 === 107 === To develop a compact fiber-based displacement measuring probe for the realization of detection on a nanoscale linear displacement with a range of few hundreds of millimeters, especially for precise positioning in a 3-axis wafer stage. The objective is realize...

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Bibliographic Details
Main Authors: CHUNG, HUI-CHIANG, 鍾惠強
Other Authors: LIN, CHIH-JER
Format: Others
Language:zh-TW
Published: 2019
Online Access:http://ndltd.ncl.edu.tw/handle/k5eu78

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