Research on the Dissipation Ability of Electrostatic Protection for IC Sealing and Testing Process

碩士 === 國立虎尾科技大學 === 光電工程系光電與材料科技碩士班 === 107 === Electrostatic damage (ESD) is an abnormal phenomenon which happens frequently in IC package process. Also, it is difficult to find out. Most of the ESD phenomena are found through a series of testing in the later process. Even some of them was due to t...

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Bibliographic Details
Main Authors: SHIH, TIEN-JEN, 石天人
Other Authors: CHEN, WEN-RAY
Format: Others
Language:zh-TW
Published: 2019
Online Access:http://ndltd.ncl.edu.tw/handle/4294vb

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