The Study of Line Width Compensation For PCB Layout Design

• Main Authors: LIN,SIAO-CHIEN, 林孝謙
• Other Authors: SHIH ,MING-CHANG
• Format: Others
• Language: zh-TW
• Published: 2019
• Online Access: http://ndltd.ncl.edu.tw/handle/7pgqnf

碩士 === 國立高雄大學 === 電機工程學系碩博士班 === 107 === In PCB circuit layout design of small line pitch, line width compensation is necessary to guaranty line width error and resistance value within meet with specification for different copper thickness and dry film thickness. Since that layout design with different thickness of copper line will cause variation of lithography and etching accuracy control. In general, PCB layout design rely on empirical adjustment to achieve the consistency of line width and electrical resistance specification, and it is not reliable to achieve consistent process qualification. In this thesis we mainly focus on the study of the optimization of line width compensation under different copper thick condition