Design and Development of a Force Measurement System with a Large Measuring Range
碩士 === 國立臺灣大學 === 機械工程學研究所 === 107 === Atomic force microscope (AFM) is a precision instrument for measuring the surface physical properties at nanoscale. Because the ability to measure both conductive and nonconducting samples in non-vacuum environment, AFM has been widely used to measure surface m...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2019
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| Online Access: | http://ndltd.ncl.edu.tw/handle/dd555u |