Design and Implementation of a 16-channel FPGA-based Digital IC Tester
碩士 === 國立臺灣大學 === 電子工程學研究所 === 107 === Automatic Test Equipment (ATE) is used to test the performance and features of the Integrated Circuit, and avoiding the defective ICs from entering to the market. Format-ter in the ATE is the vital core module to load the symbol data by user’s definition, and t...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2019
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| Online Access: | http://ndltd.ncl.edu.tw/handle/8h5m6e |