Improved Operation Characteristics of Charge Trap Flash Memory Devices by Engineering Stacked Trapping Layer

Improved Operation Characteristics of Charge Trap Flash Memory Devices by Engineering Stacked Trapping Layer

碩士 === 國立清華大學 === 工程與系統科學系 === 107

Bibliographic Details
Main Authors:	Lu, Yu-Chin, 盧育勤
Other Authors:	ChangLiao, Kuei-Shu
Format:	Others
Language:	zh-TW
Published:	2018
Online Access:	http://ndltd.ncl.edu.tw/handle/ahj6f9

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