Point diffraction interferometer applied to lens aberration measurement

碩士 === 國立中央大學 === 機械工程學系 === 107 === The purpose of the thesis is to measure the aberration in the wavefront phase information of the optical test. This experiment uses the point diffraction interferometry method and solves the wavefront caused by the optical test by the four-step phase-shifting sys...

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Main Authors: Yen-Nung Cheng, 鄭彥農
Other Authors: Ju-Yi Lee
Format: Others
Language:zh-TW
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/4bnk59
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spelling ndltd-TW-107NCU054890132019-06-01T03:42:08Z http://ndltd.ncl.edu.tw/handle/4bnk59 Point diffraction interferometer applied to lens aberration measurement 點繞射干涉儀應用於透鏡之像差量測 Yen-Nung Cheng 鄭彥農 碩士 國立中央大學 機械工程學系 107 The purpose of the thesis is to measure the aberration in the wavefront phase information of the optical test. This experiment uses the point diffraction interferometry method and solves the wavefront caused by the optical test by the four-step phase-shifting system. The phase distribution is further analyzed by the Zernike polynomial to analyze the aberrations of the wavefront phase. In this experiment, the optical path used is a common-path system and the experimental structure is relatively simple; the diffracted light with the same homology is generated by the grating, and the optical paths of the diffracted light used are similar, so that it is convenient to set up the optical test. For the detection of the aberration of the object to be tested, preliminary detection can be performed. The experimental results show that the system error percentage is within 3 percentage points, and the standard deviation is 0.002852. This thesis also discusses the measurement error, which is environmental error and system error. For the systematic error of the experiment, in the experimental step of analyzing the wavefront phase of the optical test, the error caused by the displacement amount required for the phase unwrapping is not satisfied by the phase shift, and the introduced light enters the error caused by the optical axis of the experimental system and the optical axis of the optical test are not completely aligned. The price of the components used in the system architecture of this experiment can reduce the cost of constructing an optical interferometer compared to optical interferometers currently on the market. It can be regarded as a set of measurement technology with potential for development in measuring the aberration of the optics. Ju-Yi Lee 李朱育 2018 學位論文 ; thesis 94 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立中央大學 === 機械工程學系 === 107 === The purpose of the thesis is to measure the aberration in the wavefront phase information of the optical test. This experiment uses the point diffraction interferometry method and solves the wavefront caused by the optical test by the four-step phase-shifting system. The phase distribution is further analyzed by the Zernike polynomial to analyze the aberrations of the wavefront phase. In this experiment, the optical path used is a common-path system and the experimental structure is relatively simple; the diffracted light with the same homology is generated by the grating, and the optical paths of the diffracted light used are similar, so that it is convenient to set up the optical test. For the detection of the aberration of the object to be tested, preliminary detection can be performed. The experimental results show that the system error percentage is within 3 percentage points, and the standard deviation is 0.002852. This thesis also discusses the measurement error, which is environmental error and system error. For the systematic error of the experiment, in the experimental step of analyzing the wavefront phase of the optical test, the error caused by the displacement amount required for the phase unwrapping is not satisfied by the phase shift, and the introduced light enters the error caused by the optical axis of the experimental system and the optical axis of the optical test are not completely aligned. The price of the components used in the system architecture of this experiment can reduce the cost of constructing an optical interferometer compared to optical interferometers currently on the market. It can be regarded as a set of measurement technology with potential for development in measuring the aberration of the optics.
author2 Ju-Yi Lee
author_facet Ju-Yi Lee
Yen-Nung Cheng
鄭彥農
author Yen-Nung Cheng
鄭彥農
spellingShingle Yen-Nung Cheng
鄭彥農
Point diffraction interferometer applied to lens aberration measurement
author_sort Yen-Nung Cheng
title Point diffraction interferometer applied to lens aberration measurement
title_short Point diffraction interferometer applied to lens aberration measurement
title_full Point diffraction interferometer applied to lens aberration measurement
title_fullStr Point diffraction interferometer applied to lens aberration measurement
title_full_unstemmed Point diffraction interferometer applied to lens aberration measurement
title_sort point diffraction interferometer applied to lens aberration measurement
publishDate 2018
url http://ndltd.ncl.edu.tw/handle/4bnk59
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