Numerical Study of RTN Amplitude in SiNWFETs

碩士 === 國立交通大學 === 電信工程研究所 === 107 ===   In recent years, the miniaturization of transistors has progressed according to the device scaling rule and then the geometry of the most advanced transistor reaches in the level of nano-meters. The device structure of transistor also has substantially changed...

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Bibliographic Details
Main Authors: Su, Chong-Zih, 蘇重齊
Other Authors: Watanabe, Hiroshi
Format: Others
Language:en_US
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/3fyxb6