Effect of surface passivation by two-step low pressure and temperature environment-grown thermal oxide layer for multi-crystalline silicon solar cells

博士 === 國立交通大學 === 材料科學與工程學系所 === 107 === In this study, the efficiency of the multi-crystalline was improved by inserting a two-step growth thermal oxide layer as the surface passivation layer. First, we studying lower temperature (750 °C – 780 °C) two-step grown SiOx film as passivation layers betw...

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Main Authors: Liao, Shun-Sing, 廖順興
Other Authors: Chang, Edward-Yi
Format: Others
Language:en_US
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/d8nte7
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spelling ndltd-TW-107NCTU51590412019-05-16T01:40:47Z http://ndltd.ncl.edu.tw/handle/d8nte7 Effect of surface passivation by two-step low pressure and temperature environment-grown thermal oxide layer for multi-crystalline silicon solar cells 使用二段式低壓低溫環境成長熱氧化層之多晶矽太陽能電池表面鈍化影響 Liao, Shun-Sing 廖順興 博士 國立交通大學 材料科學與工程學系所 107 In this study, the efficiency of the multi-crystalline was improved by inserting a two-step growth thermal oxide layer as the surface passivation layer. First, we studying lower temperature (750 °C – 780 °C) two-step grown SiOx film as passivation layers between SiNx and N type emitter layer under atmosphere pressure. Compared to the conventional MC-SiSC, conversion efficiency was significantly increased by 0.37% with the surface passivation layer grown by low temperature two-step TO process. Second, we show that the efficiency and carrier life time of multi-crystalline silicon solar cells were significantly improved by using a low pressure (20000 Pa) and temperature (650 °C – 750 °C) environment grown thermal oxide (TO) as the surface passivation layer. In this experiment, during the first stage, the oxidation process was done at 650 °C and a lower pressure of 20000 Pa for 2 mins under the flow a gas mixture of N2/O2 in ratio of 2:1. In the second stage, a temperature of 750 °C was used at the same pressure for the post-growth annealing process under a pure N2 ambient for 25 mins. Consequently, conversion efficiency was significantly increased by 0.55% with the surface passivation layer grown by low pressure and temperature TO process. The sheet resistance, carrier lifetime, internal quantum efficiency (IQE), increased by 6.32 Ω/sq, 22.18 μs, 4.33%, respectively, and the average reflection was reduced of 0.62%. Finally, compared to the conversion efficiency of and lower temperature (650 °C – 750 °C) plus a low pressure (20000 Pa) TO layer was increased 0.18% than lower temperature (750 °C – 780 °C) two-step under atmosphere pressure TO layer. Thus, the low pressure and temperature thermal oxidation process was an efficient way to increase the efficiency of the multi-crystalline silicon solar cells. Chang, Edward-Yi 張翼 2018 學位論文 ; thesis 50 en_US
collection NDLTD
language en_US
format Others
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description 博士 === 國立交通大學 === 材料科學與工程學系所 === 107 === In this study, the efficiency of the multi-crystalline was improved by inserting a two-step growth thermal oxide layer as the surface passivation layer. First, we studying lower temperature (750 °C – 780 °C) two-step grown SiOx film as passivation layers between SiNx and N type emitter layer under atmosphere pressure. Compared to the conventional MC-SiSC, conversion efficiency was significantly increased by 0.37% with the surface passivation layer grown by low temperature two-step TO process. Second, we show that the efficiency and carrier life time of multi-crystalline silicon solar cells were significantly improved by using a low pressure (20000 Pa) and temperature (650 °C – 750 °C) environment grown thermal oxide (TO) as the surface passivation layer. In this experiment, during the first stage, the oxidation process was done at 650 °C and a lower pressure of 20000 Pa for 2 mins under the flow a gas mixture of N2/O2 in ratio of 2:1. In the second stage, a temperature of 750 °C was used at the same pressure for the post-growth annealing process under a pure N2 ambient for 25 mins. Consequently, conversion efficiency was significantly increased by 0.55% with the surface passivation layer grown by low pressure and temperature TO process. The sheet resistance, carrier lifetime, internal quantum efficiency (IQE), increased by 6.32 Ω/sq, 22.18 μs, 4.33%, respectively, and the average reflection was reduced of 0.62%. Finally, compared to the conversion efficiency of and lower temperature (650 °C – 750 °C) plus a low pressure (20000 Pa) TO layer was increased 0.18% than lower temperature (750 °C – 780 °C) two-step under atmosphere pressure TO layer. Thus, the low pressure and temperature thermal oxidation process was an efficient way to increase the efficiency of the multi-crystalline silicon solar cells.
author2 Chang, Edward-Yi
author_facet Chang, Edward-Yi
Liao, Shun-Sing
廖順興
author Liao, Shun-Sing
廖順興
spellingShingle Liao, Shun-Sing
廖順興
Effect of surface passivation by two-step low pressure and temperature environment-grown thermal oxide layer for multi-crystalline silicon solar cells
author_sort Liao, Shun-Sing
title Effect of surface passivation by two-step low pressure and temperature environment-grown thermal oxide layer for multi-crystalline silicon solar cells
title_short Effect of surface passivation by two-step low pressure and temperature environment-grown thermal oxide layer for multi-crystalline silicon solar cells
title_full Effect of surface passivation by two-step low pressure and temperature environment-grown thermal oxide layer for multi-crystalline silicon solar cells
title_fullStr Effect of surface passivation by two-step low pressure and temperature environment-grown thermal oxide layer for multi-crystalline silicon solar cells
title_full_unstemmed Effect of surface passivation by two-step low pressure and temperature environment-grown thermal oxide layer for multi-crystalline silicon solar cells
title_sort effect of surface passivation by two-step low pressure and temperature environment-grown thermal oxide layer for multi-crystalline silicon solar cells
publishDate 2018
url http://ndltd.ncl.edu.tw/handle/d8nte7
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