A Study of Effect of Stress on the AlGaN/GaN High Electron Mobility Transistor

碩士 === 國立成功大學 === 電機工程學系 === 107

Bibliographic Details
Main Authors:	Chi-HuanHsu, 徐啓桓
Other Authors:	Wen-Shi Lee
Format:	Others
Language:	en_US
Published:	2019
Online Access:	http://ndltd.ncl.edu.tw/handle/ymfkqz

id	ndltd-TW-107NCKU5442161
record_format	oai_dc
spelling	ndltd-TW-107NCKU54421612019-10-26T06:24:16Z http://ndltd.ncl.edu.tw/handle/ymfkqz A Study of Effect of Stress on the AlGaN/GaN High Electron Mobility Transistor 氮化鋁鎵/氮化鎵高電子遷移率場效電晶體之應力影響研究 Chi-HuanHsu 徐啓桓碩士國立成功大學電機工程學系 107 Wen-Shi Lee 李文熙 2019 學位論文 ; thesis 70 en_US
collection	NDLTD
language	en_US
format	Others
sources	NDLTD
description	碩士 === 國立成功大學 === 電機工程學系 === 107
author2	Wen-Shi Lee
author_facet	Wen-Shi Lee Chi-HuanHsu 徐啓桓
author	Chi-HuanHsu 徐啓桓
spellingShingle	Chi-HuanHsu 徐啓桓 A Study of Effect of Stress on the AlGaN/GaN High Electron Mobility Transistor
author_sort	Chi-HuanHsu
title	A Study of Effect of Stress on the AlGaN/GaN High Electron Mobility Transistor
title_short	A Study of Effect of Stress on the AlGaN/GaN High Electron Mobility Transistor
title_full	A Study of Effect of Stress on the AlGaN/GaN High Electron Mobility Transistor
title_fullStr	A Study of Effect of Stress on the AlGaN/GaN High Electron Mobility Transistor
title_full_unstemmed	A Study of Effect of Stress on the AlGaN/GaN High Electron Mobility Transistor
title_sort	study of effect of stress on the algan/gan high electron mobility transistor
publishDate	2019
url	http://ndltd.ncl.edu.tw/handle/ymfkqz
work_keys_str_mv	AT chihuanhsu astudyofeffectofstressonthealganganhighelectronmobilitytransistor AT xúqǐhuán astudyofeffectofstressonthealganganhighelectronmobilitytransistor AT chihuanhsu dànhuàlǚjiādànhuàjiāgāodiànziqiānyílǜchǎngxiàodiànjīngtǐzhīyīnglìyǐngxiǎngyánjiū AT xúqǐhuán dànhuàlǚjiādànhuàjiāgāodiànziqiānyílǜchǎngxiàodiànjīngtǐzhīyīnglìyǐngxiǎngyánjiū AT chihuanhsu studyofeffectofstressonthealganganhighelectronmobilitytransistor AT xúqǐhuán studyofeffectofstressonthealganganhighelectronmobilitytransistor
_version_	1719279465963454464

A Study of Effect of Stress on the AlGaN/GaN High Electron Mobility Transistor

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