Thin TFT-LCD Shunt-Cut Best Parameters By Using The Taguchi Methods

• Main Authors: CHEN,SHIH-CHIEH, 陳仕杰
• Other Authors: 劉文豐
• Format: Others
• Language: zh-TW
• Published: 2019
• Online Access: http://ndltd.ncl.edu.tw/handle/r2v2qq

碩士 === 逢甲大學 === 電機工程學系 === 107 === Owing to the TFT-LCD to become the market trend, the shunt-cutting TFT-LCD reworking is essentially important for product yield. The purpose of this study is to find the optimal conditions and parameters for the shunt-cutting machine and to make sure that it reaches the optimum vertical crack deep and cutting quality. The experimental semi-cutting machine is the production of cutting machine company MDI and the experiment glass material is from Asahi AN100 with the thickness of 0.5 mm. Due to that the current large-scale cutting TFT-LCD was AN100 series, the cutting glass-related conditions to be optimized are necessary with the variation of system parameters including the cutting speed, cutting depth, cutting pressure and type cutter wheel change. The Taguchi Methods can be used for finding out the best success rate cut standard parameters. The experimental results show that the thin glass optimum pressure range of 17N, cutting speed of 350 mm / s, cutting depth of 0.35 mm, and the best cutter wheel type of 110215008 are the best parameters for yield rate. In the future rework it is recommended to use these parameters to reduce the defect rate of products to enhance product value.