Constructing Convolutional Neural Networks-based model for Defect Inspection and Empirical Study

Constructing Convolutional Neural Networks-based model for Defect Inspection and Empirical Study

碩士 === 元智大學 === 資訊管理學系 === 106 === Defect inspection has become more difficult with the complex process and high product-mix in the manufacturing process of thin film crystal liquid crystal display panel (TFT-LCD). The existing study of defect classification is not easy for the expert through the hu...

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Bibliographic Details
Main Authors:	Guan-Yu Cheng, 陳冠羽
Other Authors:	Chia-Yu Hsu
Format:	Others
Language:	zh-TW
Published:	2018
Online Access:	http://ndltd.ncl.edu.tw/handle/3dunqg

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