SIMULATION OF THE ELECTRIC FIELD DISTRIBUTION IN THE GAP REGION OF THE DEVICE UNDER TEST CAUSED BY THE DISCHARGE OF A REGULATION-COMPATIBLE ELECTROSTATIC DISCHARGE GUN

SIMULATION OF THE ELECTRIC FIELD DISTRIBUTION IN THE GAP REGION OF THE DEVICE UNDER TEST CAUSED BY THE DISCHARGE OF A REGULATION-COMPATIBLE ELECTROSTATIC DISCHARGE GUN

碩士 === 大同大學 === 通訊工程研究所 === 106 === ESD (Electrostatic Discharge) generators are widely used for testing IT (Information Technology) equipments based on the standard of IEC 61000-4-2. The thesis establishes a three dimensional CST model for the electrostatic discharge gun. Several parameters in the...

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Main Authors: Jui-yen Chien, 簡瑞延
Other Authors: none
Format: Others
Language:zh-TW
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/8e8f98
id ndltd-TW-106TTU05650006
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spelling ndltd-TW-106TTU056500062019-09-19T03:30:13Z http://ndltd.ncl.edu.tw/handle/8e8f98 SIMULATION OF THE ELECTRIC FIELD DISTRIBUTION IN THE GAP REGION OF THE DEVICE UNDER TEST CAUSED BY THE DISCHARGE OF A REGULATION-COMPATIBLE ELECTROSTATIC DISCHARGE GUN 模擬符合法規要求之靜電槍於放電時在待測物隙縫內產生之電場分佈 Jui-yen Chien 簡瑞延 碩士 大同大學 通訊工程研究所 106 ESD (Electrostatic Discharge) generators are widely used for testing IT (Information Technology) equipments based on the standard of IEC 61000-4-2. The thesis establishes a three dimensional CST model for the electrostatic discharge gun. Several parameters in the model are adjusted so that the characteristics of the gun (for example, the discharge current waveform of the gun) are compatible with the regulation requirement. With the regulation-compatible gun, we observe the electric field distribution in the gap region of the device under test. While the electric field in the gap region is high, we modify the shape of the gap region to reduce it. none 張知難 2018 學位論文 ; thesis 56 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 大同大學 === 通訊工程研究所 === 106 === ESD (Electrostatic Discharge) generators are widely used for testing IT (Information Technology) equipments based on the standard of IEC 61000-4-2. The thesis establishes a three dimensional CST model for the electrostatic discharge gun. Several parameters in the model are adjusted so that the characteristics of the gun (for example, the discharge current waveform of the gun) are compatible with the regulation requirement. With the regulation-compatible gun, we observe the electric field distribution in the gap region of the device under test. While the electric field in the gap region is high, we modify the shape of the gap region to reduce it.
author2 none
author_facet none
Jui-yen Chien
簡瑞延
author Jui-yen Chien
簡瑞延
spellingShingle Jui-yen Chien
簡瑞延
SIMULATION OF THE ELECTRIC FIELD DISTRIBUTION IN THE GAP REGION OF THE DEVICE UNDER TEST CAUSED BY THE DISCHARGE OF A REGULATION-COMPATIBLE ELECTROSTATIC DISCHARGE GUN
author_sort Jui-yen Chien
title SIMULATION OF THE ELECTRIC FIELD DISTRIBUTION IN THE GAP REGION OF THE DEVICE UNDER TEST CAUSED BY THE DISCHARGE OF A REGULATION-COMPATIBLE ELECTROSTATIC DISCHARGE GUN
title_short SIMULATION OF THE ELECTRIC FIELD DISTRIBUTION IN THE GAP REGION OF THE DEVICE UNDER TEST CAUSED BY THE DISCHARGE OF A REGULATION-COMPATIBLE ELECTROSTATIC DISCHARGE GUN
title_full SIMULATION OF THE ELECTRIC FIELD DISTRIBUTION IN THE GAP REGION OF THE DEVICE UNDER TEST CAUSED BY THE DISCHARGE OF A REGULATION-COMPATIBLE ELECTROSTATIC DISCHARGE GUN
title_fullStr SIMULATION OF THE ELECTRIC FIELD DISTRIBUTION IN THE GAP REGION OF THE DEVICE UNDER TEST CAUSED BY THE DISCHARGE OF A REGULATION-COMPATIBLE ELECTROSTATIC DISCHARGE GUN
title_full_unstemmed SIMULATION OF THE ELECTRIC FIELD DISTRIBUTION IN THE GAP REGION OF THE DEVICE UNDER TEST CAUSED BY THE DISCHARGE OF A REGULATION-COMPATIBLE ELECTROSTATIC DISCHARGE GUN
title_sort simulation of the electric field distribution in the gap region of the device under test caused by the discharge of a regulation-compatible electrostatic discharge gun
publishDate 2018
url http://ndltd.ncl.edu.tw/handle/8e8f98
work_keys_str_mv AT juiyenchien simulationoftheelectricfielddistributioninthegapregionofthedeviceundertestcausedbythedischargeofaregulationcompatibleelectrostaticdischargegun
AT jiǎnruìyán simulationoftheelectricfielddistributioninthegapregionofthedeviceundertestcausedbythedischargeofaregulationcompatibleelectrostaticdischargegun
AT juiyenchien mónǐfúhéfǎguīyàoqiúzhījìngdiànqiāngyúfàngdiànshízàidàicèwùxìfèngnèichǎnshēngzhīdiànchǎngfēnbù
AT jiǎnruìyán mónǐfúhéfǎguīyàoqiúzhījìngdiànqiāngyúfàngdiànshízàidàicèwùxìfèngnèichǎnshēngzhīdiànchǎngfēnbù
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