SIMULATION OF THE ELECTRIC FIELD DISTRIBUTION IN THE GAP REGION OF THE DEVICE UNDER TEST CAUSED BY THE DISCHARGE OF A REGULATION-COMPATIBLE ELECTROSTATIC DISCHARGE GUN

碩士 === 大同大學 === 通訊工程研究所 === 106 === ESD (Electrostatic Discharge) generators are widely used for testing IT (Information Technology) equipments based on the standard of IEC 61000-4-2. The thesis establishes a three dimensional CST model for the electrostatic discharge gun. Several parameters in the...

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Bibliographic Details
Main Authors: Jui-yen Chien, 簡瑞延
Other Authors: none
Format: Others
Language:zh-TW
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/8e8f98
Description
Summary:碩士 === 大同大學 === 通訊工程研究所 === 106 === ESD (Electrostatic Discharge) generators are widely used for testing IT (Information Technology) equipments based on the standard of IEC 61000-4-2. The thesis establishes a three dimensional CST model for the electrostatic discharge gun. Several parameters in the model are adjusted so that the characteristics of the gun (for example, the discharge current waveform of the gun) are compatible with the regulation requirement. With the regulation-compatible gun, we observe the electric field distribution in the gap region of the device under test. While the electric field in the gap region is high, we modify the shape of the gap region to reduce it.