Using Response Surface Methodology and Artificial Neural Network to Improve the EMC of Electronics Product –Example of Industrial PC
碩士 === 國立臺北科技大學 === 工業工程與管理系 === 106 === Due to technology advances and development increasing number of electronic devices are getting more frequent uses every day. Equipment exposed to their electromagnetic fields and waves may suffer malfunctions caused by undesired impacts which may lead to syst...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2018
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| Online Access: | http://ndltd.ncl.edu.tw/handle/x72779 |