LEAN Value Stream Map Analysis and Application on Semiconductor Assembly Process

• Main Authors: LIU, SHENG-TSUNG, 劉昇聰
• Other Authors: 陳一民
• Format: Others
• Language: zh-TW
• Published: 2018
• Online Access: http://ndltd.ncl.edu.tw/handle/6cn9zs

碩士 === 國立高雄大學 === 高階經營管理碩士在職專班(EMBA) === 106 === The research is applied “LEAN Value steam mapping analysis” on semiconductor assembly process, all the cases come from student’s experience at work. LEAN system used value steam mapping to show the material flow, information flow and operation time in mapping which easy to find the root cause of waste in process. The procedure is draw out current value stream map and through many improvement actions to redefine the value of the product in process then remove the waste to make sure the product flowing smoothly, higher efficiency. After that future value stream map produced which shown the target of improvement and going to improve continuously – included manpower reduction, cycle time reduction and WIP reduction. We can approach to LEAN system by PDCA improvement with value stream map analysis which will be a best diagnosis tool for enterprise operation management.During the research, some value stream map of enterprise looks good, but hard to apply in real operation in fact. The research gained some enlightenment from the procedure of value stream map analysis in current process, just a little bit modification “value stream map” became a sharp weapon of process diagnosis. Engineer do the process analysis more easily to get the detail of man, machine, material, tool, method of process and product operation arrangement through the mapping progress. It’s getting simple and convenient to detect the problem in process, come out improvement actions and defect root cause analysis.