Improvement of Semiconductor Process Yield Using Machine Learning and Big Data Analysis Techniques

碩士 === 國立高雄大學 === 電機工程學系-電子構裝整合技術產業碩士專班 === 106 === The latest research from Topology Research Institute pointed out that the increase in demand for mobile communication electronic products in 2017 will drive high I/O counts, high-integration, and advanced package penetration. It will also increase...

Full description

Bibliographic Details
Main Authors: YEN-HUNG Li, 李彥宏
Other Authors: Hsin-Chang Yang
Format: Others
Language:zh-TW
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/z3t563