Integrated Highly Reliable and Low-power Design Techniques for Dynamic Random Access Memories
碩士 === 國立臺灣科技大學 === 電機工程系 === 106 === Dynamic Random Access Memory (DRAM) is widely used in most modern electronic systems as main memory because of its high density, longevity, and low cost. As the VLSI technologies keep shrinkage and minimization of devices, the yield and reliability of DRAM has b...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2018
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| Online Access: | http://ndltd.ncl.edu.tw/handle/9e627s |