| Summary: | 碩士 === 國立臺灣科技大學 === 電子工程系 === 106 === This thesis presents the miscorrelation of nanosecond-scale switching characteristics measurements between ATE and the typical values in datasheet, and the correction after study and experiments. We implemented into Teradyne’s ETS-364 ATE for the differential driver and receiver pair integrated circuit(IC) SN65LBC180. SN65LBC180 was produced in IMPACT ATE, which is a legacy tester platform with a lower productivity, difficult for maintenance, occupied huge space and tested in single site only. In the tester platform to platform conversion project, SN65LBC180 was successfully converted from IMPACT ATE to ETS-364 ATE. During this conversion, the characteristics measurements are out of the specification of the datasheet, studied to dig out the root cause and provided a solution to fix. It was released into the production line with not only the test yield is greater than 97%, which is the same as IMPACT ATE, but also reduced the cost of test (COT) by quad-site testing.
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