The Study of Detecting Characteristic for Dissolved Oxygen by Semiconductor Material
碩士 === 國立臺灣海洋大學 === 電機工程學系 === 106 === The purpose of the research is to determine the concentration of dissolved oxygen by using semiconductor material. In this study, we illuminated the surface of the material by appropriate light source to active photocatalysis, then the reaction will break the b...
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ndltd-TW-106NTOU54420572019-11-28T05:22:09Z http://ndltd.ncl.edu.tw/handle/cfugz8 The Study of Detecting Characteristic for Dissolved Oxygen by Semiconductor Material 半導體材料之溶氧感測特性研究 Shih, Ming-Hao 施茗皓 碩士 國立臺灣海洋大學 電機工程學系 106 The purpose of the research is to determine the concentration of dissolved oxygen by using semiconductor material. In this study, we illuminated the surface of the material by appropriate light source to active photocatalysis, then the reaction will break the bond between oxygen, turning molecules into ions which carrying electrons, as a consequence, we can realize the change of concentration by checking current. Also, we tried to measure in various parameters to find out the best working combination of the detector. Tan, Shih-Wei 譚仕煒 2018 學位論文 ; thesis 26 zh-TW |
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碩士 === 國立臺灣海洋大學 === 電機工程學系 === 106 === The purpose of the research is to determine the concentration of dissolved oxygen by using semiconductor material. In this study, we illuminated the surface of the material by appropriate light source to active photocatalysis, then the reaction will break the bond between oxygen, turning molecules into ions which carrying electrons, as a consequence, we can realize the change of concentration by checking current. Also, we tried to measure in various parameters to find out the best working combination of the detector.
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author2 |
Tan, Shih-Wei |
author_facet |
Tan, Shih-Wei Shih, Ming-Hao 施茗皓 |
author |
Shih, Ming-Hao 施茗皓 |
spellingShingle |
Shih, Ming-Hao 施茗皓 The Study of Detecting Characteristic for Dissolved Oxygen by Semiconductor Material |
author_sort |
Shih, Ming-Hao |
title |
The Study of Detecting Characteristic for Dissolved Oxygen by Semiconductor Material |
title_short |
The Study of Detecting Characteristic for Dissolved Oxygen by Semiconductor Material |
title_full |
The Study of Detecting Characteristic for Dissolved Oxygen by Semiconductor Material |
title_fullStr |
The Study of Detecting Characteristic for Dissolved Oxygen by Semiconductor Material |
title_full_unstemmed |
The Study of Detecting Characteristic for Dissolved Oxygen by Semiconductor Material |
title_sort |
study of detecting characteristic for dissolved oxygen by semiconductor material |
publishDate |
2018 |
url |
http://ndltd.ncl.edu.tw/handle/cfugz8 |
work_keys_str_mv |
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