A Fast and Reliable Read 28nm 32kb STT-MRAM macro using Continuous-Recording-and-Enhancement Voltage-Mode Sense Amplifier

A Fast and Reliable Read 28nm 32kb STT-MRAM macro using Continuous-Recording-and-Enhancement Voltage-Mode Sense Amplifier

碩士 === 國立清華大學 === 電機工程學系所 === 106 === abstract hide

Bibliographic Details
Main Authors: Yang, Tzu-Hsien., 楊子賢
Other Authors: Chang, Meng-Fan
Format: Others
Language:en_US
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/3z2q63
Description
Summary:碩士 === 國立清華大學 === 電機工程學系所 === 106 === abstract hide

Similar Items