An Error Indication Signal Collapsing Technique for Implication-Based Concurrent Error Detection
碩士 === 國立中山大學 === 電機工程學系研究所 === 106 === Due to the development of advanced semi-conductor process, the circuit in a chip could be implemented with a smaller size. However, chips may thus tend to fail because of the defects and process variation during manufacturing. Even if a chip is verified to wor...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2018
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/965ch8 |