| Summary: | 碩士 === 國立高雄第一科技大學 === 電子工程系碩士班 === 106 === This paper presents a high-accuracy all-digital smart temperature sensor (STS), including an automatic correction and measurement system, which can more effectively improve STS accuracy and automatically assist the chips measurement to further save test time and cost. Inverter-based STS has the advantages of low cost, low power consumption. The one-point calibration technique that can eliminate the effect for process variation and reduce the testing time and cost. However, the output curve exists for a certain curvature to seriously affect the accuracy. A previously simple curvature correction circuit (CCC) was proposed to correct the curvatures of all sensors by using only one sample sensor. The method is simple and effective, but each sensor still has different curvature, so error will exist. Furthermore, the error curve is not ideally symmetrical to the calibration temperature point, a curvature correction method is proposed in this paper, and more sensors curvature parameters () and linear parameters () can be calculated by automatic curvature correction system. The proposed modified CCC to accurately remove each sensor curve error and linearity error to obtain the best accuracy, the correct technique can be directly suitable for all CMOS processes. The proposed STS was implemented in eight Xilinx Field Programmable Gate Arrays (FPGA) for performance verification. The logic utilization for total circuit is 89 slices, which is increased by 16% compared to the previous with 74 slices. The error in the temperature range from -20 °C to 100 °C is improved from 1.6 ºC to 1.1 ºC, which is equivalent to a precision improvement of more than 30%. This result is effectively proved that the proposed method has its significance. Finally, the automatic correction and measurement system can assist the measurement of chips read and report, can greatly reduce labor costs and time.
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