Improving the TFT-LCD’s Array Yield by Six Sigma Method -A Case Study for PVD Metal Film Peeling of company I

碩士 === 國立交通大學 === 管理學院管理科學學程 === 106 === Along with the advance of science and technology, both new processes and new products are introduced continuously in the TFT-LCD industry. The biggest challenge for enterprises is how to reduce costs and improve quality in the environment with severe competit...

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Bibliographic Details
Main Authors: Liou, Chin-Heng, 劉晉亨
Other Authors: Chiang, Chi
Format: Others
Language:zh-TW
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/y4r4f5
Description
Summary:碩士 === 國立交通大學 === 管理學院管理科學學程 === 106 === Along with the advance of science and technology, both new processes and new products are introduced continuously in the TFT-LCD industry. The biggest challenge for enterprises is how to reduce costs and improve quality in the environment with severe competition and rapid technical change. Since 1990, there are excellent outcomes in quality improvement by utilizing six sigma methodology which has gradually been valued. Six sigma methodology composed of define, measure, analysis, improve, control and many management tools, is an approach based on data to solve problems. It can improve quality and enhance competitiveness of enterprises effectively and rapidly. In this study, we focus on improving PVD metal peeling ratio in the Array TF segment of TFT-LCD. According to the DMAIC process of six sigma methodology that analyze causes of defects. Then, we find the key influencing factor and testing each factor by using statistic method. At last, we make the optimized method from key factor that convert into standardized control, and monitor the result of improvement. Finally, we reach the financial goals of reducing scrap rates and cutting costs that make enterprises more competitive and run sustainably.