Statistical Investigation of Transconductance Distribution in Program/Erase Cycling of NAND Flash
碩士 === 國立交通大學 === 電信工程研究所 === 106 === In recent years, reliability issues are taken more seriously with the scaling of NAND Flash memory. This thesis investigates the trapped charge generation and impact in the tunneling oxide. Nowadays, there have been many studies on the prediction of the trapped...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2018
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| Online Access: | http://ndltd.ncl.edu.tw/handle/z2rx5t |