Physical Mechanism of Structure-dependent Bias Stability and Illuminated Hot-carrier effect on Reliability of InGaZnO Thin-Film Transistors for Advanced Displays

博士 === 國立交通大學 === 電子物理系所 === 106 === In recent years, along with rapid development of flat panel display industry, widely used in electronic products, such as high resolution television, notebook computers, digital cameras and intelligent information products. Thin film transistors (TFTs) play impor...

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Bibliographic Details
Main Authors: Yang, Chung-I, 楊崇巽
Other Authors: Chou, Wu-Ching
Format: Others
Language:en_US
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/h83t75