Characteristic investigation of n-type SnO2 thin film transistors with ultraviolet exposure

碩士 === 國立交通大學 === 電子研究所 === 106

Bibliographic Details
Main Authors: Weng,Yu-Wei, 翁有為
Other Authors: Chin, Albert
Format: Others
Language:en_US
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/7qbeh3