| Summary: | 碩士 === 國立交通大學 === 照明與能源光電研究所 === 106 === The microscope we use is a laser scanning confocal microscope that combines two scanning systems of nanopositioning stage and galvanometer. Scanning by using the nanopositioning stage is able to take images of high resolution, whereas the galvanometer scanning system allows fast image scanning with a limited resolution. To take advantage of both systems, it is necessary to calibration the images taken by using both scanning systems.
The two different scanning methods cause image divergence in translation, rotation, and scaling, etc. To remove the image divergence, we develop an image calibration procedure by using the Otsu method to acquire the best binarization automatically, and then by utilizing phase correlation with interpolation to calculate the translation, rotation, and scaling parameters for accurately calibrating the galvanometer image to the nanopositioning stage image. We developed a computation process and a user-friendly interface to automatically accomplish the calibration after the images are taken.
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