Gate Dielectric Optimization of High Performance GaN Metal-Insulator-Semiconductor High Electron Mobility Transistors.
碩士 === 國立交通大學 === 光電工程研究所 === 106 === Recent progress in high power field-effect transistors (FETs) was focused on GaN-based wide band-gap (WBG) semiconductors. Recent progress in high power fieldeffect transistors (FET) focused on GaN-based wide band-gap semiconductors. GaN-based high electron mobi...
Main Authors: | Yang, Shang-Chieh, 楊上頡 |
---|---|
Other Authors: | Kuo, Hao-Chung |
Format: | Others |
Language: | en_US |
Published: |
2017
|
Online Access: | http://ndltd.ncl.edu.tw/handle/6x4kw9 |
Similar Items
-
Dielectric reliability in GaN metal-insulator-semiconductor high electron mobility transistors
by: Lee, Ethan S
Published: (2019) -
Dielectric reliability in high-voltage GaN metal-insulator-semiconductor high electron mobility transistors
by: Warnock, Shireen M
Published: (2017) -
Time dependent dielectric breakdown in novel GaN metal-insulator-semiconductor high electron mobility transistors
by: Lednev, Alexander I.(Alexander Igorevich)
Published: (2019) -
AlGaN/GaN Metal-Oxide-Semiconductor High Electron Mobility Transistors Using Liquid-phase Deposited High-k Gate Dielectrics
by: Tsu-YiWu, et al.
Published: (2013) -
Analysis of DC Characteristics in GaN-Based Metal-Insulator-Semiconductor High Electron Mobility Transistor with Variation of Gate Dielectric Layer Composition by Considering Self-Heating Effect
by: In-Tae Hwang, et al.
Published: (2019-09-01)