Characteristic Prediction of Antireflection Optical Thin Films by Model Trees

• Main Authors: Shuo-HanWeng, 翁碩韓
• Other Authors: Tzu-tsung Wong
• Format: Others
• Language: zh-TW
• Published: 2018
• Online Access: http://ndltd.ncl.edu.tw/handle/s8wf5r

碩士 === 國立成功大學 === 工業與資訊管理學系碩士在職專班 === 106 === Modern manufacturing industry of glass coating manufacturing industry is highly competitive, and the decision for efficiently reducing manufacturing costs is important for a company to enhance its competitiveness. The usage of the large amount of data collected from manufacturing processes is not effective, and hence the high production cost is generally caused by the decisions based on personal experience. This study attempts to use the data with plenty of attributes collected from production equipment to build model trees for predicting the characteristics of antireflection optical thin films, including reflection rate and the a and b values of glass color coordinates. The model trees can provide the critical attributes that will affect the characteristics of products. This kind of information can help engineers to set proper manufacturing parameters for reducing setup time and labor cost. The experimental results show that the prediction error of the reflectivity rate is the smallest, and the model tree for each of the three optical characteristics does suggest critical attributes for improving product quality.