A variable block size pattern run-length codingfor test data compression
碩士 === 元智大學 === 資訊工程學系 === 105 === The testing data compression is one of popular topics in VLSI testing field. It also is the key to solve the huge data test data. Built-in-self-test (BIST) architecture which can test the circuit itself can generate the data inside the circuit under test without an...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2017
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| Online Access: | http://ndltd.ncl.edu.tw/handle/5f3443 |