Research and Development of Probe-clamping Mechanism for AFM

碩士 === 國立臺北科技大學 === 機電整合研究所 === 105 === A probe clamping mechanism was developed in this research for atomic force microscope. It was designed the taper at a movable lower jaw probe clamping, and coordinated with the fix upper jaw which made the probe to be able to automatically positioned and finis...

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Bibliographic Details
Main Authors: Shu-Kai,Ding, 丁書楷
Other Authors: 徐正會,吳明川
Format: Others
Language:zh-TW
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/24g4ye