The Influence of Valid and In-force Patents in Patentometrics
博士 === 國立臺灣大學 === 圖書資訊學研究所 === 105
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ndltd-TW-105NTU054480092019-05-15T23:39:38Z http://ndltd.ncl.edu.tw/handle/2t6u4a The Influence of Valid and In-force Patents in Patentometrics 有效專利對專利計量分析之影響研究 Huei-Ru Dong 董蕙茹 博士 國立臺灣大學 圖書資訊學研究所 105 Mu-hsuan Huang 黃慕萱 2017 學位論文 ; thesis 195 zh-TW |
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zh-TW |
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Others
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博士 === 國立臺灣大學 === 圖書資訊學研究所 === 105 |
author2 |
Mu-hsuan Huang |
author_facet |
Mu-hsuan Huang Huei-Ru Dong 董蕙茹 |
author |
Huei-Ru Dong 董蕙茹 |
spellingShingle |
Huei-Ru Dong 董蕙茹 The Influence of Valid and In-force Patents in Patentometrics |
author_sort |
Huei-Ru Dong |
title |
The Influence of Valid and In-force Patents in Patentometrics |
title_short |
The Influence of Valid and In-force Patents in Patentometrics |
title_full |
The Influence of Valid and In-force Patents in Patentometrics |
title_fullStr |
The Influence of Valid and In-force Patents in Patentometrics |
title_full_unstemmed |
The Influence of Valid and In-force Patents in Patentometrics |
title_sort |
influence of valid and in-force patents in patentometrics |
publishDate |
2017 |
url |
http://ndltd.ncl.edu.tw/handle/2t6u4a |
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