The Influence of Valid and In-force Patents in Patentometrics

博士 === 國立臺灣大學 === 圖書資訊學研究所 === 105

Bibliographic Details
Main Authors: Huei-Ru Dong, 董蕙茹
Other Authors: Mu-hsuan Huang
Format: Others
Language:zh-TW
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/2t6u4a
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spelling ndltd-TW-105NTU054480092019-05-15T23:39:38Z http://ndltd.ncl.edu.tw/handle/2t6u4a The Influence of Valid and In-force Patents in Patentometrics 有效專利對專利計量分析之影響研究 Huei-Ru Dong 董蕙茹 博士 國立臺灣大學 圖書資訊學研究所 105 Mu-hsuan Huang 黃慕萱 2017 學位論文 ; thesis 195 zh-TW
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language zh-TW
format Others
sources NDLTD
description 博士 === 國立臺灣大學 === 圖書資訊學研究所 === 105
author2 Mu-hsuan Huang
author_facet Mu-hsuan Huang
Huei-Ru Dong
董蕙茹
author Huei-Ru Dong
董蕙茹
spellingShingle Huei-Ru Dong
董蕙茹
The Influence of Valid and In-force Patents in Patentometrics
author_sort Huei-Ru Dong
title The Influence of Valid and In-force Patents in Patentometrics
title_short The Influence of Valid and In-force Patents in Patentometrics
title_full The Influence of Valid and In-force Patents in Patentometrics
title_fullStr The Influence of Valid and In-force Patents in Patentometrics
title_full_unstemmed The Influence of Valid and In-force Patents in Patentometrics
title_sort influence of valid and in-force patents in patentometrics
publishDate 2017
url http://ndltd.ncl.edu.tw/handle/2t6u4a
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